K60P100M100SF2RM Datasheet, PDF (792/1809 Pages) Freescale Semiconductor, Inc – K60 Sub-Family Reference Manual

Memory Map/Register Definition
RNG_SR field descriptions (continued)
Field
Description
Reflects the current state of RNGB. If RNGB is currently seeding, generating the next seed, creating a
new random number, or performing a self test, this bit is set.
0
Reserved
0 Not busy.
1 Busy.
This read-only field is reserved and always has the value one.
Reserved, must be set.
33.3.5 RNGB Error Status Register (RNG_ESR)
Address: RNG_ESR is 400A_0000h base + 10h offset = 400A_0010h
Bit 31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
16
R
0
W
Reset 0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Bit 15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
0
R
0
FUFE SATE STE OSCE LFE
W
Reset 0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Field
31–5
Reserved
4
FUFE
RNG_ESR field descriptions
Description
This read-only field is reserved and always has the value zero.
Reserved, must be cleared.
FIFO underflow error
Indicates the RNGB has experienced a FIFO underflow condition resulting in the last random data read
being unreliable. This bit can be masked by RNG_CR[FUFMOD] and is cleared by hardware or software
reset or by writing one to RNG_CMD[CE].
3
SATE
0 FIFO underflow has not occurred.
1 FIFO underflow has occurred
Statistical test error.
Indicates if RNGB has failed the statistical tests for the last generated seed. This bit is sticky and is
cleared by a hardware or software reset or by writing one to RNG_CMD[CE].
0 RNGB has not failed the statistical tests.
1 RNGB has failed the statistical tests during initialization.
2
Self test error.
STE
Indicates the RNGB has failed the most recent self test. This bit is sticky and can only be reset by a
hardware reset or by writing one to RNG_CMD[CE].
Table continues on the next page...
K60 Sub-Family Reference Manual, Rev. 6, Nov 2011
792
Freescale Semiconductor, Inc.