PXS20RM Datasheet, PDF (548/1368 Pages) Freescale Semiconductor, Inc – PXS20 Microcontroller

Fault Collection and Control Unit (FCCU)
Table 22-32. FCCU mapping of non-critical faults (continued)
Non-critical
fault
Source
Signal description
Short / long /
none default
func reset
Set /
clear
injection
Fault
enabled
Time-out
enabled
NCF[11]
ADC_NCF_1 Internal self test (non critical
—
fault)
NCF[12]
STCU_NCF Bist results (non critical faults)
—
NCF[13]
LVD_ 1.2V LVD BIST OK in test mode/
—
LVD NOK in user mode
NCF[14]
HVD_ 1.2V HVD BIST OK in test mode/
—
HVD NOK in user mode
NCF[15]
LVD VREG LVD VREG fault detected by
—
self-checking. (refer
Table 39-2 for further
clarifications)
NCF[16]
LVD FLASH LVD FLASH fault detected by
—
self-checking (refer
Table 39-2 for further
clarifications)
NCF[17]
LVD IO
LVD IO fault detected by
—
self-checking (refer
Table 39-2 for further
clarifications)
NCF[18]
—
—
—
NCF[19]
FLEXR_ECN ECC 1-bit error correction
—
notification from flexray
NCF[20]
FLEXR_NCE ECC not correctable error
—
from flexray(combination of
LRAM and DRAM ECC
errors)
NCF[21]
MC_ME
Software device reset
—
NCF[22] BP_BALLAST0¹ Bypass Ballast0
—
NCF[23] BP_BALLAST1¹ Bypass Ballast1
—
NCF[24] BP_BALLAST2¹ Bypass Ballast2
—
NCF[25]
—
—
—
NCF[26]
—
—
—
NCF[27]
—
—
—
NCF[28]
—
—
—
NCF[29]
—
—
—
NCF[30]
—
—
—
NCF[31]
—
—
—
Yes (by Yes
Yes
ADC
itself)
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
No
No
No
No
No
Yes
No
Yes
Yes
No
No
Yes
No
Yes
Yes
No
Yes
Yes
No
Yes
Yes
No
No
No
No
No
No
No
No
No
No
No
No
No
No
No
No
No
No
No
No
No
22-48
PXS20 Microcontroller Reference Manual, Rev. 1
Freescale Semiconductor