PXD10RM Datasheet, PDF (556/1332 Pages) Freescale Semiconductor, Inc – PXD10 Microcontroller

Table 17-2. Test Flash Structure for Code Flash 0 (Block 0) (continued)
Name
NVLML
NVHBL
NVSLL
Description
Addresses
Size
Non-volatile Low/Mid address space block Locking register 0x403DE8 to 0x403DEF 8 byte
Non-volatile High address space Block Locking register
0x403DF0 to 0x403DF7 8 byte
Non-volatile Secondary Low/mid add space block Lock register 0x403DF8 to 0x403DFF 8 byte
User Reserved
0x403E00 to 0x403EFF 256 byte
Reserved
0x403F00 to 0x403FFF 256 byte
Table 17-3. Test Flash Structure for Data Flash 0 (Block 1)
Name
NVLML
NVHBL
NVSLL
Description
Addresses
Size
User OTP Area
0xC00000 to 0xC01FFF 8192 byte
Reserved
0xC02000 to 0xC03CFF 7424 byte
User Reserved
0xC03D00 to 0xC03DE7 232 byte
Non-volatile Low/Mid address space block Locking register 0xC03DE8 to 0xC03DEF 8 byte
Non-volatile High address space Block Locking register 0xC03DF0 to 0xC03DF7 8 byte
Non-volatile Secondary Low/mid add space block Lock register 0xC03DF8 to 0xC03DFF 8 byte
User Reserved
0xC03E00 to 0xC03EFF 256 byte
Reserved
0xC03F00 to 0xC03FFF 256 byte
Table 17-4. Test Flash Structure for Code Flash 1 (Block 2)
Name
NVLML
NVHBL
NVSLL
Description
Addresses
Size
User OTP Area
0x480000 to 0x481FFF 8192 byte
Reserved
0x482000 to 0x483CFF 7424 byte
User Reserved
0x483D00 to 0x483DE7 232 byte
Non-volatile Low/Mid address space block Locking register 0x483DE8 to 0x483DEF 8 byte
Non-volatile High address space Block Locking register
0x483DF0 to 0x483DF7 8 byte
Non-volatile Secondary Low/mid add space block Lock register 0x483DF8 to 0x483DFF 8 byte
User Reserved
0x483E00 to 0x483EFF 256 byte
Reserved
0x483F00 to 0x483FFF 256 byte
Erase of Test Flash block is always locked.
Program of the Test Flash block has similar restriction as the array in terms of how ECC is calculated. Only
one program is allowed per 64-bit ECC segment.
The first 8 KB of Test Flash block may be used for user defined functions (possibly to store serial numbers,
other configuration words or factory process codes). Locations of the Test Flash other than the first 8 KB
of OTP Area cannot be programmed by the user application.
17-6
PXD10 Microcontroller Reference Manual, Rev. 1
Preliminary—Subject to Change Without Notice
Freescale Semiconductor