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PIC16LF18854 Datasheet, PDF (617/668 Pages) Microchip Technology – C Compiler Optimized RISC Architecture | |||
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PIC16(L)F18856/76
FIGURE 37-7:
Cycle
FOSC
CLKOUT
I/O pin
(Input)
I/O pin
(Output)
CLKOUT AND I/O TIMING
Write
Q4
Fetch
Q1
IO1
IO8
Read
Q2
IO10
IO4
IO5
Old Value
IO3
IO7, IO8
Execute
Q3
IO2
IO7
New Value
TABLE 37-10: I/O AND CLKOUT TIMING SPECIFICATIONS
Standard Operating Conditions (unless otherwise stated)
Param.
No.
Sym.
Characteristic
Min.
IO1*
TCLKOUTH CLKOUT rising edge delay (rising edge
â
Fosc (Q1 cycle) to falling edge CLKOUT
IO2*
TCLKOUTL CLKOUT falling edge delay (rising edge
â
Fosc (Q3 cycle) to rising edge CLKOUT
IO3*
TIO_VALID Port output valid time (rising edge Fosc
â
(Q1 cycle) to port valid)
IO4*
TIO_SETUP Port input setup time (Setup time before
20
rising edge Fosc â Q2 cycle)
IO5*
TIO_HOLD Port input hold time (Hold time after rising
50
edge Fosc â Q2 cycle)
IO6*
TIOR_SLREN Port I/O rise time, slew rate enabled
â
IO7*
TIOR_SLRDIS Port I/O rise time, slew rate disabled
â
IO8*
TIOF_SLREN Port I/O fall time, slew rate enabled
â
IO9*
TIOF_SLRDIS Port I/O fall time, slew rate disabled
â
IO10* TINT
INT pin high or low time to trigger an
25
interrupt
IO11* TIOC
Interrupt-on-Change minimum high or low
25
time to trigger interrupt
*These parameters are characterized but not tested.
Typâ Max. Units Conditions
â
70
ns
â
72
ns
50
70
ns
â
â
ns
â
â
ns
25
â
ns VDD = 3.0V
5
â
ns VDD = 3.0V
25
â
ns VDD = 3.0V
5
â
ns VDD = 3.0V
â
â
ns
â
â
ns
ï£ 2016 Microchip Technology Inc.
Preliminary
DS40001824A-page 617
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