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PIC16LF18854 Datasheet, PDF (351/668 Pages) Microchip Technology – C Compiler Optimized RISC Architecture
PIC16(L)F18856/76
FIGURE 23-9:
DIFFERENTIAL CVD WITH GUARD RING OUTPUT WAVEFORM
VDD
VSS
First Sample
Second Sample
Time
FIGURE 23-10: HARDWARE CVD SEQUENCE TIMING DIAGRAM
Precharge
Time
1-127 TINST
(TPRE)
Acquisition/
Sharing Time
1-127 TINST
(TACQ)
Conversion Time
(Traditional Timing of ADC Conversion)
TCY - TAD TAD1 TAD2 TAD3 TAD4 TAD5 TAD6 TAD7 TAD8 TAD9 TAD10 TAD11
b9 b8 b7 b6 b5 b4 b3 b2 b1 b0
External and Internal External and Internal
Channels are
Channels share
Conversion starts
charged/discharged charge
Holding capacitor CHOLD is disconnected from analog input (typically 100 ns)
If ADPRE  0
If ADACQ 0
Set GO/DONE bit
If ADPRE = 0
If ADACQ = 0
(Traditional Operation Start)
23.4.5
ADDITIONAL SAMPLE AND HOLD
CAPACITANCE
Additional capacitance can be added in parallel with the
internal sample and hold capacitor (CHOLD) by means
of the ADCAP register. This register selects a digitally
programmable capacitance which is added to the ADC
conversion bus, increasing the effective internal capac-
itance of the sample and hold capacitor in the ADC
module. This is used to improve the match between
internal and external capacitance for a better sensing
performance. The additional capacitance does not
affect analog performance of the ADC because it is not
connected during conversion. See Figure 23-11.
23.5 Computation Operation
The ADC module hardware is equipped with post
conversion computation features. These features
provide data post-processing functions that can be
operated on the ADC conversion result, including
digital filtering/averaging and threshold comparison
functions.
On the following cycle:
AADRES0H:AADRES0L is loaded,
ADIF bit is set,
GO/DONE bit is cleared
 2016 Microchip Technology Inc.
Preliminary
DS40001824A-page 351