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C8051F970-A-GM Datasheet, PDF (12/454 Pages) Silicon Laboratories – Low Power Capacitive Sensing MCU with up to 32 kB of Flash | |||
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C8051F97x
Table 1.2. Global Electrical Characteristics (Continued)
â40 to +85 °C, 25 MHz system clock unless otherwise specified.
Parameter
Conditions
Min
Typ
Max units
Digital Supply CurrentâCPU Inactive (Idle Mode, not fetching instructions from Flash)
IDD4
VDD = 1.8â3.6 V,
â
3.3
4.5
mA
Freq = 24.5 MHz (includes preci-
sion oscillator current)
VDD = 1.8â3.6 V, Freq = 20 MHz â
2.5
â
mA
(includes low power oscillator
current)
VDD = 1.8â3.6 V,
Freq = 32.768 kHz
(includes RTC current)
â
90
â
µA
IDD Frequency Sensitivity1
VDD = 1.8-3.6 V, T = 25 °C
â
110
â µA/MHz
Notes:
1. Based on device characterization data; Not production tested.
2. SYSCLK must be at least 32 kHz to enable debugging.
3. The values in this table are obtained with the CPU executing an âsjmp $â loop, which is the compiled form of a while(1)
loop in C. See the power measurement code examples for more information.
4. Includes oscillator and regulator supply current.
12
Rev 1.0
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