MMC2107 Datasheet, PDF (544/618 Pages) –

Freescale Semiconductor, Inc.
JTAG Test Access Port and OnCE
21.5.5 HIGHZ Instruction
The HIGHZ instruction is provided as a manufacturer’s optional public
instruction to prevent having to backdrive the output pins during
circuit-board testing. When HIGHZ is invoked, all output drivers,
including the 2-state drivers, are turned off (for example, high
impedance). The instruction selects the bypass register. HIGHZ also
asserts internal reset for the MMC2107 system logic to force a
predictable internal state.
21.5.6 CLAMP Instruction
The CLAMP instruction selects the bypass register and asserts internal
reset while simultaneously forcing all output pins and bidirectional pins
configured as outputs to the fixed values that are preloaded and held in
the boundary scan update register. This instruction enhances test
efficiency by reducing the overall shift path to a single bit (the bypass
register) while conducting an EXTEST type of instruction through the
boundary scan register.
21.5.7 BYPASS Instruction
The BYPASS instruction selects the single-bit bypass register, creating
a single-bit shift register path from the TDI pin to the bypass register to
the TDO pin. This instruction enhances test efficiency by reducing the
overall shift path when a device other than the MMC2107 processor
becomes the device under test on a board design with multiple chips on
the overall IEEE 1149.1 standard defined boundary scan chain. The
bypass register has been implemented in accordance with IEEE 1149.1
standard so that the shift register state is set to logic 0 on the rising edge
of TCLK following entry into the capture-DR state. Therefore, the first bit
to be shifted out after selecting the bypass register is always a logic 0 (to
differentiate a part that supports an IDCODE register from a part that
supports only the bypass register).
Technical Data
544
JTAG Test Access Port and OnCE
For More Information On This Product,
Go to: www.freescale.com
MMC2107 – Rev. 2.0
MOTOROLA