MMC2107 Datasheet, PDF (128/618 Pages) –

Signal Description
Freescale Semiconductor, Inc.
4.5.10 Test Signal (TEST)
This input signal (TEST) is reserved for factory testing only and should
be connected to V_SS to prevent unintentional activation of test functions.
4.5.11 Power and Ground Signals
These signals provide system power and ground to the chip. Multiple
signals are provided for adequate current capability. All power supply
signals must have adequate bypass capacitance for high-frequency
noise suppression.
4.5.11.1 Power for FLASH Erase/Program (V_PP)
This signal supplies an isolated power for FLASH program and erase
operations.
4.5.11.2 Power and Ground for FLASH Array (V_DDF and V_SSF)
These signals supply an isolated power and ground to the FLASH array.
4.5.11.3 Standby Power (V_STBY)
This signal is used to provide standby voltage to the RAM array if V_DD is
lost.
4.5.11.4 Positive Supply (V_DD)
This signal supplies positive power to the core logic and I/O pads.
4.5.11.5 Ground (V_SS)
This signal is the negative supply (ground) to the chip.
Technical Data
128
Signal Description
For More Information On This Product,
Go to: www.freescale.com
MMC2107 – Rev. 2.0
MOTOROLA