SAM4L Datasheet, PDF (70/1185 Pages) ATMEL Corporation – ATSAM ARM-based Flash MCU

ATSAM4L4/L2
8.7.14.4
CLAMP
This instruction selects the Bypass register as Data Register. The device output pins are driven
from the boundary-scan chain.
Starting in Run-Test/Idle, the CLAMP instruction is accessed the following way:
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the output pins.
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: A logic ‘0’ is loaded into the Bypass Register.
8. In Shift-DR: Data is scanned from TDI to TDO through the Bypass register.
9. Return to Run-Test/Idle.
Table 8-8. CLAMP Details
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
Details
0101 (0x5)
p00s
1
x
x
70
42023C–SAM–02/2013