SAM4L Datasheet, PDF (69/1185 Pages) ATMEL Corporation – ATSAM ARM-based Flash MCU

ATSAM4L4/L2
8.7.14.3
INTEST
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. Return to Run-Test/Idle.
5. Select the DR Scan path.
6. In Capture-DR: The Data on the external pins are sampled into the boundary-scan
chain.
7. In Shift-DR: The boundary-scan chain is shifted by the TCK input.
8. Return to Run-Test/Idle.
Table 8-6. SAMPLE_PRELOAD Details
Instructions
Details
IR input value
0001 (0x1)
IR output value
p00s
DR Size
Depending on boundary-scan chain, see BSDL-file.
DR input value
Depending on boundary-scan chain, see BSDL-file.
DR output value
Depending on boundary-scan chain, see BSDL-file.
This instruction selects the boundary-scan chain as Data Register for testing internal logic in the
device. The logic inputs are determined by the boundary-scan chain, and the logic outputs are
captured by the boundary-scan chain. The device output pins are driven from the boundary-scan
chain.
Starting in Run-Test/Idle, the INTEST instruction is accessed the following way:
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the internal logic
inputs.
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: The data on the internal logic is sampled into the boundary-scan chain.
8. In Shift-DR: The boundary-scan chain is shifted by the TCK input.
9. In Update-DR: The data from the boundary-scan chain is applied to internal logic inputs.
10. Return to Run-Test/Idle.
Table 8-7. INTEST Details
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
Details
0100 (0x4)
p001
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
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