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MC9S12G Datasheet, PDF (1076/1160 Pages) Freescale Semiconductor, Inc – Ignores external trigger. Performs one conversion sequence and stops. | |||
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Electrical Characteristics
This device contains circuitry protecting against damage due to high static voltage or electrical ï¬elds;
however, it is advised that normal precautions be taken to avoid application of any voltages higher than
maximum-rated voltages to this high-impedance circuit. Reliability of operation is enhanced if unused
inputs are tied to an appropriate logic voltage level (e.g., either VSS35 or VDD35).
Table A-1. Absolute Maximum Ratings1
Num
Rating
Symbol
Min
1 I/O, regulator and analog supply voltage
2 Voltage difference VDDX to VDDA
3 Voltage difference VSSX to VSSA
4 Digital I/O input voltage
5 Analog reference
6 EXTAL, XTAL
7 Instantaneous maximum current
Single pin limit for all digital I/O pins2
VDD35
âVDDX
âVSSX
VIN
VRH
VILV
ID
8 Instantaneous maximum current
IDL
Single pin limit for EXTAL, XTAL
9 Storage temperature range
Tstg
1 Beyond absolute maximum ratings device might be damaged.
2 All digital I/O pins are internally clamped to VSSX and VDDX, or VSSA and VDDA.
â0.3
â6.0
â0.3
â0.3
â0.3
â0.3
â25
â25
â65
Max
Unit
6.0
V
0.3
V
0.3
V
6.0
V
6.0
V
2.16
V
+25
mA
+25
mA
155
°C
A.1.6 ESD Protection and Latch-up Immunity
All ESD testing is in conformity with CDF-AEC-Q100 stress test qualiï¬cation for automotive grade
integrated circuits. During the device qualiï¬cation ESD stresses were performed for the Human Body
Model (HBM) and the Charge Device Model.
A device will be deï¬ned as a failure if after exposure to ESD pulses the device no longer meets the device
speciï¬cation. Complete DC parametric and functional testing is performed per the applicable device
speciï¬cation at room temperature followed by hot temperature, unless speciï¬ed otherwise in the device
speciï¬cation.
Table A-2. ESD and Latch-up Test Conditions
Model
Human Body
Description
Series Resistance
Storage Capacitance
Number of Pulse per pin
positive
negative
Symbol
Value
Unit
R1
1500
â¦
C
100
pF
-
-
3
3
MC9S12G Family Reference Manual, Rev.1.01
1076
Freescale Semiconductor
This document is valid for the S12G96 and the S12G128 device. All information related to other devices is preliminary.
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