DRA722_17 Datasheet, PDF (127/408 Pages) Texas Instruments – Infotainment Applications Processor

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DRA722, DRA724, DRA725, DRA726
SPRS956B – MARCH 2016 – REVISED JANUARY 2017
Table 5-1. Absolute Maximum Rating Over Junction Temperature Range (continued)
PARAMETER⁽¹⁾
MIN
MAX
UNIT
V_IO (Steady-State)
Input and Output Voltage Ranges
(Steady-State)
Core I/Os
Analog I/Os (except HDMI)
-0.3
1.5
V
-0.3
2.0
V
HDMI I/Os
-0.3
3.5
V
I/O 1.35V
-0.3
1.65
V
I/O 1.5V
-0.3
1.8
V
1.8V I/Os
-0.3
2.1
V
3.3V I/Os (except those powered by -0.3
3.8
V
vddshv8)
3.3V I/Os (powered by vddshv8)
-0.3
3.6
V
SR
Maximum slew rate, all supplies
10⁵
V/s
V_IO (Transient Overshoot /
Undershoot)
Input and Output Voltage Ranges (Transient Overshoot/Undershoot)
Note: valid for up to 20% of the signal period
0.2*VDD
V
(2)
T_J
Operating junction temperature
Automotive
range
-40
+125
°C
T_STG
Latch-up I-Test
Latch-up OV-Test
Storage temperature range after soldered onto PC Board
-55
+150
°C
I-test⁽³⁾, All I/Os (if different levels then one line per level)
-100
100
mA
Over-voltage Test⁽⁴⁾, All supplies (if different levels then one line per level) N/A 1.5*Vsup
V
ply max
(1) See I/Os supplied by this power pin in Table 4-2 Ball Characteristics
(2) VDD is the voltage on the corresponding power-supply pin(s) for the IO.
(3) Per JEDEC JESD78 at 125°C with specified I/O pin injection current and clamp voltage of 1.5 times maximum recommended I/O
voltage and negative 0.5 times maximum recommended I/O voltage.
(4) Per JEDEC JESD78 at 125°C.
5.2 ESD Ratings
Table 5-2. ESD Ratings
Human-Body model (HBM), per AEC Q100-002⁽¹⁾
VALUE
±1000
V_ESD Electrostatic discharge
Charged-device model (CDM), per AEC
Q100-011
HDMIPHY Pins
(AG16, AH16, AG19,
AH19, AG18, AH18,
AG17, AH17)
All Pins (other than
HDMIPHY)
±200
±250
Corner pins (A1,
AH1, A28, AH28)
±750
(1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
UNIT
V
5.3 Power on Hour (POH) Limits
The information in the section below is provided solely for your convenience and does not extend or
modify the warranty provided under TI’s standard terms and conditions for TI semiconductor products.
NOTE
POH is a functional of voltage, temperature and time. Usage at higher voltages and
temperatures will result in a reduction in POH to achieve the same reliability performance.
For assessment of alternate use cases, contact your local TI representative.
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Specifications 127