C8051F93X Datasheet, PDF (208/330 Pages) Silicon Laboratories – Pipelined intstruction architecture executes 70 of instruction in 1 or 2 system clocks

C8051F93x-C8051F92x
20.2.4. Automatic Gain Control (Crystal Mode Only) and SmaRTClock Bias Doubling
Automatic Gain Control allows the SmaRTClock oscillator to trim the oscillation amplitude of a crystal in
order to achieve the lowest possible power consumption. Automatic Gain Control automatically detects
when the oscillation amplitude has reached a point where it safe to reduce the drive current, therefore, it
may be enabled during crystal startup. It is recommended to enable Automatic Gain Control in most
systems which use the SmaRTClock oscillator in Crystal Mode. The following are recommended crystal
specifications and operating conditions when Automatic Gain Control is enabled:
• ESR < 50 k
• Load Capacitance < 10 pF
• Supply Voltage < 3.0 V
• Temperature > –20 °C
When using Automatic Gain Control, it is recommended to perform an oscillation robustness test to ensure
that the chosen crystal will oscillate under the worst case condition to which the system will be exposed.
The worst case condition that should result in the least robust oscillation is at the following system
conditions: lowest temperature, highest supply voltage, highest ESR, highest load capacitance, and lowest
bias current (AGC enabled, Bias Double Disabled).
To perform the oscillation robustness test, the SmaRTClock oscillator should be enabled and selected as
the system clock source. Next, the SYSCLK signal should be routed to a port pin configured as a push-pull
digital output. The positive duty cycle of the output clock can be used as an indicator of oscillation
robustness. As shown in Figure 20.2, duty cycles less than 55% indicate a robust oscillation. As the duty
cycle approaches 60%, oscillation becomes less reliable and the risk of clock failure increases. Increasing
the bias current (by disabling AGC) will always improve oscillation robustness and will reduce the output
clock’s duty cycle. This test should be performed at the worst case system conditions, as results at very
low temperatures or high supply voltage will vary from results taken at room temperature or low supply
voltage.
Safe Operating Zone
Low Risk of Clock High Risk of Clock
Failure
Failure
25%
55%
60%
Duty Cycle
Figure 20.2. Interpreting Oscillation Robustness (Duty Cycle) Test Results
As an alternative to performing the oscillation robustness test, Automatic Gain Control may be disabled at
the cost of increased power consumption (approximately 200 nA). Disabling Automatic Gain Control will
provide the crystal oscillator with higher immunity against external factors which may lead to clock failure.
Automatic Gain Control must be disabled if using the SmaRTClock oscillator in self-oscillate mode.
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Rev. 1.3