S912XHY128F0VLM Datasheet, PDF (742/802 Pages) Freescale Semiconductor, Inc – S12 Microcontrollers

Electrical Characteristics
Table A-17. NVM Reliability Characteristics
Conditions are shown in Table A-4 unless otherwise noted
Num C
Rating
Symbol Min Typ Max Unit
P-Flash Array
1 C Data retention at an average junction temperature of T_Javg =
85°C¹ after up to 10,000 program/erase cycles
2 C Data retention at an average junction temperature of T_Javg =
85°C³ after less than 100 program/erase cycles
3 C P-Flash number of program/erase cycles
(-40°C ≤ tj ≤ 150°C)
t_PNVMRET
15
100²
—
Years
t_PNVMRET
20
100²
—
Years
n_PFLPE
10K 100K³ — Cycles
D-Flash Array
4 C Data retention at an average junction temperature of T_Javg =
85°C³ after up to 50,000 program/erase cycles
t_DNVMRET
5
100²
—
Years
5 C Data retention at an average junction temperature of T_Javg =
85°C³ after less than 10,000 program/erase cycles
t_DNVMRET
10
100²
—
Years
6 C Data retention at an average junction temperature of T_Javg =
85°C³ after less than 100 program/erase cycles
t_DNVMRET
20
100²
—
Years
7 C D-Flash number of program/erase cycles (-40°C ≤ tj ≤ 150°C)
n_DFLPE
50K 500K³ — Cycles
1 ^TJavg ^{does not exceed 85°C in a typical temperature profile over the lifetime of a consumer, industrial or automotive}
application.
2 ^{Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated}
to 25°C using the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please
refer to Engineering Bulletin EB618
3 ^TJavg ^{does not exceed 85°C in a typical temperature profile over the lifetime of a consumer, industrial or automotive}
application.
MC9S12XHY-Family Reference Manual, Rev. 1.01
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Freescale Semiconductor