S912XHY128F0VLM Datasheet, PDF (741/802 Pages) Freescale Semiconductor, Inc – S12 Microcontrollers

Electrical Characteristics
Table A-16. NVM Timing Characteristics
Conditions are as shown in Table A-4, with 40MHz bus and f_NVMOP= 1MHz unless otherwise noted.
Num C
Rating
Symbol
Min
Typ
1 D External oscillator clock
f_NVMOSC
2
—
2 D Bus frequency for programming or erase operations
f_NVMBUS
1
—
3 D Operating frequency
f_NVMOP
800
—
4 D P-Flash phrase programming
t_bwpgm
—
171
6 P P-Flash sector erase time
t_era
—
20
7 P Erase All Blocks (Mass erase) time
t_mass
—
101
7a D Unsecure Flash
8 D P-Flash erase verify (blank check) time²
t_uns
—
101
t_check
—
—
9a D D-Flash word programming 1 word
t_dpgm
—
97
9b D D-Flash word programming 2 words
t_dpgm
—
167
9c D D-Flash word programming 3 words
t_dpgm
—
237
9d D D-Flash word programming 4 words
t_dpgm
—
307
9e D D-Flash word programming 4 words crossing row
boundary
t_dpgm
—
335
10 D D-Flash sector erase time
t_eradf
—
5.2³
11 D D-Flash erase verify (blank check) time
t_check
—
—
1 ^{Restrictions for oscillator in crystal mode apply.}
2 ^{Valid for both “Erase verify all” or “Erase verify block” on 256K block without failing locations}
3 ^{This is a typical value for a new device}
Max
40¹
40
1050
183
21
102
102
33500²
104
181
258
335
363
Unit
MHz
MHz
kHz
µs
ms
ms
ms
t_cyc
µs
µs
µs
µs
µs
21
ms
17500
t_cyc
A.3.2 NVM Reliability Parameters
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The data retention and program/erase cycling failure rates are specified at the operating conditions noted.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed.
The standard shipping condition for both the D-Flash and P-Flash memory is erased with security disabled.
However it is recommended that each block or sector is erased before factory programming to ensure that
the full data retention capability is achieved. Data retention time is measured from the last erase operation.
MC9S12XHY-Family Reference Manual, Rev. 1.01
Freescale Semiconductor
741