English
Language : 

TCI6630K2L Datasheet, PDF (11/298 Pages) Texas Instruments – Multicore DSP+ARM KeyStone II System-on-Chip
www.ti.com
TCI6630K2L
SPRS893E – MAY 2013 – REVISED JANUARY 2015
KeyStone Architecture Semaphore2 Hardware Module User's Guide
KeyStone II Architecture Serializer/Deserializer (SerDes) User's Guide
KeyStone Architecture Serial Peripheral Interface (SPI) User's Guide
KeyStone Architecture Turbo Decoder Coprocessor 3 (TCP3d) User's Guide
KeyStone Architecture Turbo Encoder Coprocessor 3 (TCP3e) User's Guide
KeyStone Architecture Universal Asynchronous Receiver/Transmitter (UART) User's Guide
KeyStone II Architecture Universal Serial Bus 3.0 (USB 3.0) User's Guide
KeyStone II Architecture IQN2 User's Guide
SPRUGS3
SPRUHO3
SPRUGP2
SPRUGS0
SPRUGS1
SPRUGP1
SPRUHJ7
SPRUH06
3.6 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the
respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views;
see TI's Terms of Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster
collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge,
explore ideas and help solve problems with fellow engineers.
TI Embedded Processors Wiki Texas Instruments Embedded Processors Wiki. Established to help
developers get started with Embedded Processors from Texas Instruments and to foster
innovation and growth of general knowledge about the hardware and software surrounding
these devices.
3.7 Trademarks
C6000, Code Composer Studio, DSP/BIOS, XDS, E2E are trademarks of Texas Instruments.
MPCore is a trademark of ARM Ltd or its subsidiaries.
ARM, Cortex are registered trademarks of ARM Ltd or its subsidiaries.
All other trademarks are the property of their respective owners.
3.8 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
3.9 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
Copyright © 2013–2015, Texas Instruments Incorporated
Submit Documentation Feedback
Product Folder Links: TCI6630K2L
Device Characteristics
11