GMS30C7201 Datasheet, PDF (336/352 Pages) Hynix Semiconductor – 60MHz operation frequency Low power consumption

Debug and Test Interface
14.4 Production Test Features
In order to generate test vectors suitable for use on a production tester by the chip manufacturer,
some special test modes have been introduced. These modes come into operation whenever the
pin nTEST is forced LOW.
Full details of these modes are available from ARM in a special Test Document on request.
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GMS30C7201 Data Sheet