GMS30C7201 Datasheet, PDF (312/352 Pages) Hynix Semiconductor – 60MHz operation frequency Low power consumption

Debug and Test Interface
14.1 Overview
The GMS30C7201 has built-in features which enable debug and test in a number of different
contexts. Firstly, there are circuit structures to help with software development. Secondly, the
device contains boundary scan cells for circuit board test. Finally, the device contains some
special test modes which enable the generation production patterns for the device itself.
14-2
GMS30C7201 Data Sheet