GMS30C7201 Datasheet, PDF (299/352 Pages) Hynix Semiconductor – 60MHz operation frequency Low power consumption

Name
OTR
P0
AIADN
SWXN
Type
In
In
In
Out
Source/
Destination
AD Converter
AD Converter
AD Converter
AD Converter
SWYN
Out AD Converter
SWXP
SWYP
Out AD Converter
Out AD Converter
13.11.4AIC Unit Register Address Map
Slow AMBA Peripherals
Description
ADC test signal.
ADC test signal.
ADC test signal.
Drive signal for the touch panel of X-axis. This signal is used to
switch touch panel bias transistors.
Note: when driving the touch panel, only one of the SWXN or
SWYN signals go HIGH at any one time.
Drive signal for the touch panel of Y-axis. This signal is used to
switch the bias transistors.
Note: when driving the touch panel, only one of the SWXN or
SWYN signals go HIGH at any one time.
Inverted SWXN register.
Inverted SWYN register.
Table 13-54: AIC signal descriptions (Continued)
Address
AIC Base + 0x00
AIC Base + 0x04
AIC Base + 0x08
AIC Base + 0x0C
AIC Base + 0x10
AIC Base + 0x30
AIC Base + 0x34
AIC Base + 0x38
AIC Base + 0x3C
AIC Base + 0x50 to
AIC Base + 0x5C
AIC Base + 0x70
AIC Base + 0x80
AIC Base + 0x84
Name
AICTCTR
AICBCTR
AICSCTR
AICPOWER
AICSR
AICTPDR0
AICTPDR1
AICTPDR2
AICTPDR3
AICSDR0 to
AICSDR3
AICBDR
AICTSTCR
AICTSTR0
Description
R/W
Size
(bits)
Touch panel control register
R/W
8
Battery control register
R/W
8
Sound control register
R/W
8
Power down control register
R/W
8
Status register
RO
8
Touch panel 1st sample data register (X,Y)
RO
32
Touch panel 2nd sample data register (X,Y)
RO
32
Touch panel 3rd sample data register (X,Y)
RO
32
Touch panel 4th sample data register (X,Y)
RO
32
Sound data register 0–3. Each register stores 4 x 8-bits of
RO
32
sound data.
Main and backup battery data register
RO
16
Test control register
R/W
8
This is a test register to allow the clock (ACLK) signal to the RO
8
ADC to be read back. This register is readable in both normal
mode and test mode.
Table 13-55: AIC unit register address map
GMS30C7201 Data Sheet
13-71