GMS30C7201 Datasheet, PDF (306/352 Pages) Hynix Semiconductor – 60MHz operation frequency Low power consumption

Slow AMBA Peripherals
Test mode control registers (AICTSTCR)
This 8-bit register controls the AIC unit test mode.
Bit
Initial
Name
Function
7
0
TSTCR7
Test enable
0 - normal mode
1 - test mode
6
0
TSTCR6
Test mode bit
0 - AIC test mode
1 - ADC test mode
5
0
TSTCR5
TicClkEn
0 - AIC input clk - PCLK
1 - AIC input clk - TCLK
4
0
TSTCR4
OclkSelect.
This bit is used only to test the AIC block:
0 - The clock (OCLK) generated inside AIC is
used. OCLK is slow.
1 - PCLK is used instead of OCLK to increase
the speed in test mode.
3
0
TSTCR3
TcountMode
This bit is used to reduce the touch panel interrupt
interval, and is used only in test mode.
0 - normal interrupt interval
1 - fixed interrupt interval, regardless of
sampling rate
2
0
TSTCR2
Test bit
0 - normal output to ADC
1 - test output to ADC
1–0
-
-
Reserved
Table 13-69: AICTSTCR bit functions
Test registers (AICTSTR0–AICTSTR4, ADCTSTR0–ADCTSTR4)
Ten 8-bit registers are used to save data for the AIC unit test and ADC unit test. The functions
of each of the registers are described below. The AICTSTR0, AICTSTR1, ADCTSTR0 and
ADCTSTR1 registers can be read and written, but the others are read-only registers.
Bit
Initial
Name
7
X
Clock
6–0
-
-
Function
Bit is to read outgoing ACLK signals to ADC. In
normal mode, PCLK is bypassed to ACLK, but in
test mode ACLK has the value of TCLK. This
register is readable in both normal mode and test
mode.
Reserved
Table 13-70: AICTSTR0 bit functions
13-78
GMS30C7201 Data Sheet