LM3S9B81 Datasheet, PDF (500/1155 Pages) Texas Instruments – Stellaris® LM3S9B81 Microcontroller

Analog-to-Digital Converter (ADC)
nibbles select the input pin, while the ADCSSCTLn nibbles contain the sample control bits
corresponding to parameters such as temperature sensor selection, interrupt enable, end of
sequence, and differential input mode. Sample sequencers are enabled by setting the respective
ASENn bit in the ADC Active Sample Sequencer (ADCACTSS) register and should be configured
before being enabled. Sampling is then initiated by setting the SSn bit in the ADC Processor Sample
Sequence Initiate (ADCPSSI) register. In addition, sample sequences may be initiated on multiple
ADC modules simultaneously using the GSYNC and SYNCWAIT bits in the ADCPSSI register during
the configuration of each ADC module. For more information on using these bits, refer to page 535.
When configuring a sample sequence, multiple uses of the same input pin within the same sequence
is allowed. In the ADCSSCTLn register, the IEn bits can be set for any combination of samples,
allowing interrupts to be generated after every sample in the sequence if necessary. Also, the END
bit can be set at any point within a sample sequence. For example, if Sequencer 0 is used, the END
bit can be set in the nibble associated with the fifth sample, allowing Sequencer 0 to complete
execution of the sample sequence after the fifth sample.
After a sample sequence completes execution, the result data can be retrieved from the ADC
Sample Sequence Result FIFO (ADCSSFIFOn) registers. The FIFOs are simple circular buffers
that read a single address to "pop" result data. For software debug purposes, the positions of the
FIFO head and tail pointers are visible in the ADC Sample Sequence FIFO Status (ADCSSFSTATn)
registers along with FULL and EMPTY status flags. Overflow and underflow conditions are monitored
using the ADCOSTAT and ADCUSTAT registers.
13.3.2
Module Control
Outside of the sample sequencers, the remainder of the control logic is responsible for tasks such
as:
■ Interrupt generation
■ DMA operation
■ Sequence prioritization
■ Trigger configuration
■ Comparator configuration
■ External voltage reference
■ Sample phase control
Most of the ADC control logic runs at the ADC clock rate of 14-18 MHz. The internal ADC divider
is configured for 16-MHz operation automatically by hardware when the system XTAL is selected.
13.3.2.1
Interrupts
The register configurations of the sample sequencers and digital comparators dictate which events
generate raw interrupts, but do not have control over whether the interrupt is actually sent to the
interrupt controller. The ADC module's interrupt signals are controlled by the state of the MASK bits
in the ADC Interrupt Mask (ADCIM) register. Interrupt status can be viewed at two locations: the
ADC Raw Interrupt Status (ADCRIS) register, which shows the raw status of the various interrupt
signals; and the ADC Interrupt Status and Clear (ADCISC) register, which shows active interrupts
that are enabled by the ADCIM register. Sequencer interrupts are cleared by writing a 1 to the
corresponding IN bit in ADCISC. Digital comparator interrupts are cleared by writing a 1 to the ADC
Digital Comparator Interrupt Status and Clear (ADCDCISC) register.
500
June 29, 2010
Texas Instruments-Advance Information