EP4CE30F29C7N Datasheet, PDF (262/488 Pages) Altera Corporation – Cyclone IV Device Handbook, Volume 1

10–6
Chapter 10: JTAG Boundary-Scan Testing for Cyclone IV Devices
Boundary-Scan Description Language Support
Figure 10–3 shows the JTAG chain of mixed voltages and how a level shifter is
inserted in the chain.
Figure 10–3. JTAG Chain of Mixed Voltages
Must be
3.3-V
tolerant
TDI
3.3-V
V_CCIO
2.5-V
V_CCIO
Tester
TDO
Level
Shifter
1.5-V
V_CCIO
1.8-V
V_CCIO
Shift TDO to
level accepted by
tester if necessary
Must be
1.8-V
tolerant
Must be
2.5-V
tolerant
Boundary-Scan Description Language Support
The boundary-scan description language (BSDL), a subset of VHDL, provides a
syntax that allows you to describe the features of an IEEE Std. 1149.1/IEEE Std. 1149.6
BST-capable device that can be tested.
f For more information about how to download BSDL files for IEEE Std.
1149.1-compliant Cyclone IV E devices, refer to IEEE Std. 1149.1 BSDL Files.
f For more information about how to download BSDL files for IEEE Std.
1149.6-compliant Cyclone IV GX devices, refer to IEEE Std. 1149.6 BSDL Files.
f
You can also generate BSDL files (pre-configuration and post-configuration) for
IEEE Std. 1149.1/IEEE Std. 1149.6-compliant Cyclone IV devices with the Quartus^® II
software version 9.1 SP1 and later. For more information about the procedure to
generate BSDL files using the Quartus II software, refer to BSDL Files Generation in
Quartus II.
Cyclone IV Device Handbook,
Volume 1
December 2013 Altera Corporation