EP2S90F1020C5 Datasheet, PDF (714/768 Pages) Altera Corporation – Stratix II Device Handbook, Volume 1

References
References
Referenced
Documents
Bleeker, H., P. van den Eijnden, and F. de Jong. Boundary-Scan Test: A
Practical Approach. Eindhoven, The Netherlands: Kluwer Academic
Publishers, 1993.
Institute of Electrical and Electronics Engineers, Inc. IEEE Standard Test
Access Port and Boundary-Scan Architecture (IEEE Std 1149.1-2001). New
York: Institute of Electrical and Electronics Engineers, Inc., 2001.
Maunder, C. M., and R. E. Tulloss. The Test Access Port and Boundary-Scan
Architecture. Los Alamitos: IEEE Computer Society Press, 1990.
This chapter references the following documents:
■ Configuration & Testing chapter in volume 1 of the Stratix II Device
Handbook
■ Configuration & Testing chapter in volume 1 of the Stratix II GX Device
Handbook
■ Configuring Stratix II & Stratix II GX Devices chapter in volume 2 of the
Stratix II Device Handbook
■ Configuring Stratix II & Stratix II GX Devices chapter in volume 2 of the
Stratix II GX Device Handbook
Document
Table 9–5 shows the revision history for this chapter.
Revision History
Table 9–5. Document Revision History (Part 1 of 2)
Date and
Document
Version
January 2008,
v3.3
No change
February 2007
v3.2
April 2006, v3.1
Changes Made
Added “Referenced Documents” section.
Minor text edits.
For the Stratix II GX Device Handbook only:
Formerly chapter 14. The chapter number changed
due to the addition of the Stratix II GX Dynamic
Reconfiguration chapter. No content change.
Added the “Document Revision History” section to
this chapter.
Chapter updated as part of the Stratix II Device
Handbook update.
Summary of Changes
—
—
—
—
—
9–22
Stratix II Device Handbook, Volume 2
Altera Corporation
January 2008