M1AFS600-PQ208 Datasheet, PDF (200/334 Pages) Microsemi Corporation – Fusion Family of Mixed Signal FPGAs

Device Architecture
2.5 V LVCMOS
Low-Voltage CMOS for 2.5 V is an extension of the LVCMOS standard (JESD8-5) used for general-
purpose 2.5 V applications.
Table 2-110 • Minimum and Maximum DC Input and Output Levels
2.5 V
LVCMOS
VIL
VIH
VOL
VOH IOL IOH IOSL IOSH IIL¹ IIH²
Drive
Strength
Min.
V
Max.
V
Min.
V
Max.
V
Max.
V
Min.
V
Max.
mA mA mA³
Max.
mA³ µA⁴ µA⁴
Applicable to Pro I/O Banks
4 mA
–0.3
0.7
1.7
3.6
0.7
1.7
44
18
16 10 10
8 mA
–0.3
0.7
1.7
3.6
0.7
1.7
88
37
32 10 10
12 mA
–0.3
0.7
1.7
3.6
0.7
1.7 12 12 74
65 10 10
16 mA
–0.3
0.7
1.7
3.6
0.7
1.7 16 16 87
83 10 10
24 mA
–0.3
0.7
1.7
3.6
0.7
1.7 24 24 124 169 10 10
Applicable to Advanced I/O Banks
2 mA
–0.3
0.7
1.7
2.7
0.7
1.7
22
18
16 10 10
4 mA
–0.3
0.7
1.7
2.7
0.7
1.7
44
18
16 10 10
6 mA
–0.3
0.7
1.7
2.7
0.7
1.7
66
37
32 10 10
8 mA
–0.3
0.7
1.7
2.7
0.7
1.7
88
37
32 10 10
12 mA
–0.3
0.7
1.7
2.7
0.7
1.7 12 12 74
65 10 10
16 mA
–0.3
0.7
1.7
2.7
0.7
1.7 16 16 87
83 10 10
24 mA
–0.3
0.7
1.7
2.7
0.7
1.7 24 24 124 169 10 10
Applicable to Standard I/O Banks
2 mA
–0.3
0.7
1.7
3.6
0.7
1.7
22
18
16 10 10
4 mA
–0.3
0.7
1.7
3.6
0.7
1.7
44
18
16 10 10
6 mA
–0.3
0.7
1.7
3.6
0.7
1.7
66
37
32 10 10
8 mA
–0.3
0.7
1.7
3.6
0.7
1.7
88
37
32 10 10
Notes:
1. IIL is the input leakage current per I/O pin over recommended operation conditions where –0.3 V < VIN < VIL.
2. IIH is the input leakage current per I/O pin over recommended operating conditions VIH < VIN < VCCI. Input current is
larger when operating outside recommended ranges.
3. Currents are measured at high temperature (100°C junction temperature) and maximum voltage.
4. Currents are measured at 85°C junction temperature.
5. Software default selection highlighted in gray.
Test Point
Data Path
35 pF
R=1k
Test Point
Enable Path
R to VCCI for t_LZ / t_ZL / t_ZLS
R to GND for t_HZ / t_ZH / t_ZHS
35 pF for t_ZH / t_ZHS / t_ZL / t_ZLS
35 pF for t_HZ / t_LZ
Figure 2-120 • AC Loading
Table 2-111 • AC Waveforms, Measuring Points, and Capacitive Loads
Input Low (V)
Input High (V)
Measuring Point* (V)
VREF (typ.) (V)
0
2.5
1.2
–
Note: *Measuring point = Vtrip. See Table 2-90 on page 2-169 for a complete table of trip points.
C_LOAD (pF)
35
2-184
Revision 4