M1AFS600-PQ208 Datasheet, PDF (193/334 Pages) Microsemi Corporation – Fusion Family of Mixed Signal FPGAs

Fusion Family of Mixed Signal FPGAs
Table 2-99 • Short Current Event Duration before Failure
Temperature
–40°C
0°C
25°C
70°C
85°C
100°C
Time before Failure
>20 years
>20 years
>20 years
5 years
2 years
6 months
Table 2-100 • Schmitt Trigger Input Hysteresis
Hysteresis Voltage Value (typ.) for Schmitt Mode Input Buffers
Input Buffer Configuration
Hysteresis Value (typ.)
3.3 V LVTTL/LVCMOS/PCI/PCI-X (Schmitt trigger mode)
240 mV
2.5 V LVCMOS (Schmitt trigger mode)
140 mV
1.8 V LVCMOS (Schmitt trigger mode)
80 mV
1.5 V LVCMOS (Schmitt trigger mode)
60 mV
Table 2-101 • I/O Input Rise Time, Fall Time, and Related I/O Reliability
Input Buffer
Input Rise/Fall Time (min.) Input Rise/Fall Time (max.)
Reliability
LVTTL/LVCMOS (Schmitt trigger
disabled)
No requirement
10 ns*
20 years (100°C)
LVTTL/LVCMOS (Schmitt trigger
enabled)
No requirement
No requirement, but input
20 years (100°C)
noise voltage cannot exceed
Schmitt hysteresis
HSTL/SSTL/GTL
No requirement
10 ns*
10 years (100°C)
LVDS/BLVDS/M-LVDS/LVPECL
No requirement
10 ns*
10 years (100°C)
Note:
*The maximum input rise/fall time is related only to the noise induced into the input buffer trace. If the noise is
low, the rise time and fall time of input buffers, when Schmitt trigger is disabled, can be increased beyond the
maximum value. The longer the rise/fall times, the more susceptible the input signal is to the board noise.
Microsemi recommends signal integrity evaluation/characterization of the system to ensure there is no excessive
noise coupling into input signals.
Revision 4
2- 177