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MC68HC11KW1 Datasheet, PDF (207/238 Pages) Motorola, Inc – High-density complementary metal oxide semiconductor HCMOS) microcontroller unit
A.3
Test methods
Clocks,
~VDD
strobes
Inputs
Outputs
~VDD
~VSS
0.4 V
~VSS
VDD – 0.8V
0.4 V
nominal
nominal
nominal timing
70% of VDD
20% of VDD
VDD – 0.8V
0.4 V
(b) DC testing
Clocks,
~VDD
strobes
Inputs
Outputs
~VDD
~VSS
20% of VDD ~VSS 20% of VDD
spec.
spec. timing
20% of VDD
70% of VDD
spec.
70% of VDD
VDD – 0.8V (2)
0.4V (2)
70% of VDD
20% of VDD
(c) AC testing
Notes:
(1) Full test loads are applied during all DC electrical tests and AC timing measurements.
(2) During AC timing measurements, inputs are driven to 0.4V and VDD – 0.8V;
timing measurements are taken at the 20% and 70% of VDD points.
Figure A-1 Test methods
A
MC68HC11KW1
ELECTRICAL SPECIFICATIONS
A-3