S9S12XS256J0CAL Datasheet, PDF (660/738 Pages) Freescale Semiconductor, Inc – Microcontrollers

Electrical Characteristics
Table A-1. Absolute Maximum Ratings¹
Num
Rating
Symbol
Min
Max
Unit
1 ^{I/O, regulator and analog supply voltage}
2 ^{Digital logic supply voltage2}
3 ^{PLL supply voltage2}
4 ^{NVM supply voltage2}
5 ^{Voltage difference V}DDX ^{to V}DDA
6 ^{Voltage difference V}SSX ^{to V}SSA
7 ^{Digital I/O input voltage}
V_DD35
V_DD
V_DDPLL
V_DDF
∆_VDDX
∆_VSSX
V_IN
–0.3
–0.3
–0.3
–0.3
–6.0
–0.3
–0.3
6.0
V
2.16
V
2.16
V
3.6
V
0.3
V
0.3
V
6.0
V
8 ^{Analog reference}
9 ^{EXTAL, XTAL}
V_RH, V_RL
V_ILV
–0.3
–0.3
6.0
V
2.16
V
11 ^{Instantaneous maximum current}
Single pin limit for all digital I/O pins³
I_D
–25
+25
mA
12
Instantaneous maximum current
Single pin limit for EXTAL, XTAL⁴
I_DL
–25
+25
mA
14 ^{Maximum current}
Single pin limit for power supply pins
I_DV
–100
+100
mA
15 ^{Storage temperature range}
Tstg
–65
155
°C
1 ^{Beyond absolute maximum ratings device might be damaged.}
2 ^{The device contains an internal voltage regulator to generate the logic and PLL supply out of the I/O supply. The absolute}
maximum ratings apply when the device is powered from an external source.
3 ^{All digital I/O pins are internally clamped to V}SSX ^{and V}DDX^{, or V}SSA ^{and V}DDA^.
4 ^{Those pins are internally clamped to V}SSPLL ^{and V}DDPLL^.
A.1.6 ESD Protection and Latch-up Immunity
All ESD testing is in conformity with CDF-AEC-Q100 stress test qualification for automotive grade
integrated circuits. During the device qualification ESD stresses were performed for the Human Body
Model (HBM) and the Charge Device Model.
A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification. Complete DC parametric and functional testing is performed per the applicable device
specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.
S12XS Family Reference Manual, Rev. 1.13
660
Freescale Semiconductor