S9S12XS256J0CAL Datasheet, PDF (651/738 Pages) Freescale Semiconductor, Inc – Microcontrollers

64 KByte Flash Module (S12XFTMR64K1V1)
NOTE
Field margin levels can be used to check that Flash memory contents have
adequate margin for data retention at the normal level setting. If unexpected
results are encountered when checking Flash memory contents at field
margin levels, the Flash memory contents should be erased and
reprogrammed.
20.4.2.14 Erase Verify D-Flash Section Command
The Erase Verify D-Flash Section command will verify that a section of code in the D-Flash is erased. The
Erase Verify D-Flash Section command defines the starting point of the data to be verified and the number
of words.
Table 20-59. Erase Verify D-Flash Section Command FCCOB Requirements
CCOBIX[2:0]
FCCOB Parameters
000
0x10
Global address [22:16] to
identify the D-Flash block
001
Global address [15:0] of the first word to be verified
010
Number of words to be verified
Upon clearing CCIF to launch the Erase Verify D-Flash Section command, the Memory Controller will
verify the selected section of D-Flash memory is erased. The CCIF flag will set after the Erase Verify
D-Flash Section operation has completed.
Table 20-60. Erase Verify D-Flash Section Command Error Handling
Register
FSTAT
Error Bit
ACCERR
FPVIOL
MGSTAT1
MGSTAT0
Error Condition
Set if CCOBIX[2:0] != 010 at command launch
Set if command not available in current mode (see Table 20-28)
Set if an invalid global address [22:0] is supplied
Set if a misaligned word address is supplied (global address [0] != 0)
Set if the requested section breaches the end of the D-Flash block
None
Set if any errors have been encountered during the read
Set if any non-correctable errors have been encountered during the read
20.4.2.15 Program D-Flash Command
The Program D-Flash operation programs one to four previously erased words in the D-Flash block. The
Program D-Flash operation will confirm that the targeted location(s) were successfully programmed upon
completion.
S12XS Family Reference Manual, Rev. 1.13
Freescale Semiconductor
651