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5. Maximum partitioning
Appendix A Electrical Characteristics
A.3.2 NVM Reliability Parameters
The reliability of the NVM blocks is guaranteed by stress test during qualiï¬cation, constant process
monitors and burn-in to screen early life failures.
The data retention and program/erase cycling failure rates are speciï¬ed at the operating conditions noted.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed.
Freescale Semiconductor
MC9S12XE-Family Reference Manual Rev. 1.25
1231
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