S912XEG128J2MAA Datasheet, PDF (1205/1324 Pages) Freescale Semiconductor, Inc – Microcontrollers

Appendix A Electrical Characteristics
specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.
Table A-2. ESD and Latch-up Test Conditions
Model
Description
Human Body Series resistance
Storage capacitance
Number of pulse per pin
Positive
Negative
Charged Device Number of pulse per pin
Positive
Negative
Latch-up
Minimum input voltage limit
Maximum input voltage limit
Symbol
R1
C
—
—
—
—
Value
1500
100
1
1
3
3
–2.5
7.5
Unit
Ohm
pF
V
V
Num
1
2
3
4
Table A-3. ESD and Latch-Up Protection Characteristics
C
Rating
C Human Body Model (HBM)
C Charge Device Model (CDM) corner pins
Charge Device Model (CDM) edge pins
C Latch-up current at T_A = 125°C
Positive
Negative
C Latch-up current at T_A = 27°C
Positive
Negative
Symbol
V_HBM
V_CDM
I_LAT
I_LAT
Min
2000
750
500
+100
–100
+200
–200
Max
Unit
—
V
—
V
—
mA
—
—
mA
—
—
Freescale Semiconductor
MC9S12XE-Family Reference Manual Rev. 1.25
1205