S912XEG128J2MAA Datasheet, PDF (1230/1324 Pages) Freescale Semiconductor, Inc – Microcontrollers

Appendix A Electrical Characteristics
A.3.1.24 EEE Copy Down
The typical EEE copy down time is given by the following equation
t_dfcd = (14000 + (316 ⋅ ERPART) + (1500 ⋅ (124 – DFPART))) × _f--N----_V---_M-1---_B---_U----_S-
The maximum EEE copy down time is given by the following equation
t_dfcd = (34000 + (316 ⋅ ERPART) + (1500 ⋅ (124 – DFPART))) × _f--N----_V---_M-1---_B---_U----_S-
Worst case for Enable EEPROM Emulation allows for all the EEE records to have to be copied which is a
very low probability scenario only likely in the case that the EEE is mostly full of unchanging data (the
records for which are stored in consecutive D-Flash sectors).
Table A-19. NVM Timing Characteristics
Conditions are as shown in Table A-4, with f_NVMBUS = 50MHz and f_NVMOP= 1MHz unless otherwise noted.
Num C
Rating
Symbol
Min
Typ
Max
1 D External oscillator clock
f_NVMOSC
2
—
2 D Bus frequency for programming or erase operations
f_NVMBUS
1
—
3 D Operating frequency
f_NVMOP
800
—
4 D P-Flash phrase programming
t_bwpgm
—
162
5a D P- Flash phrase program time using D-LOAD on 4 blocks t_bwpgm4
—
231
5b D P-Flash phrase program time using D-LOAD on 3 blocks t_bwpgm3
—
208
5c D P-Flash phrase program time using D-LOAD on 2 blocks t_bwpgm2
—
185
6 P P-Flash sector erase time
t_era
—
20
7 P Erase All Blocks (Mass erase) time
t_mass
—
101
7a D Unsecure Flash
8 D P-Flash erase verify (blank check) time⁽²⁾
t_uns
—
101
t_check
—
—
9a D D-Flash word programming one word
t_dpgm
—
88
9b D D-Flash word programming two words
t_dpgm
—
153
9c D D-Flash word programming three words
t_dpgm
—
212
9d D D-Flash word programming four words
t_dpgm
—
282
9e D D-Flash word programming four words crossing row
t_dpgm
—
298
boundary
10 D D-Flash sector erase time
t_eradf
—
5.2⁽³⁾
11 D D-Flash erase verify (blank check) time
t_check
—
—
12 D EEE copy down (mask sets 5M48H, 3M25J, 2M53J,
1M12S, 1N35H, 1N36H)
t_dfrcd
—
255000
12 D EEE copy down (other mask sets)
t_dfrcd
—
1. Restrictions for oscillator in crystal mode apply.
2. Valid for both “Erase verify all” or “Erase verify block” on 256K block without failing locations
3. This is a typical value for a new device
4. Maximum partitioning
205000
50⁽¹⁾
50
1050
173
264
233
202
21
102
102
33500²
95
165
230
316
342
21
17500
275000⁽⁴⁾
225000⁽⁵⁾
Unit
MHz
MHz
kHz
µs
µs
µs
µs
ms
ms
ms
t_cyc
µs
µs
µs
µs
µs
ms
t_cyc
t_cyc
t_cyc
1230
MC9S12XE-Family Reference Manual Rev. 1.25
Freescale Semiconductor