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C8051F124-GQR Datasheet, PDF (19/350 Pages) Silicon Laboratories – Mixed Signal ISP Flash MCU Family
C8051F120/1/2/3/4/5/6/7
C8051F130/1/2/3
1. System Overview
The C8051F12x and C8051F13x device families are fully integrated mixed-signal System-on-a-Chip
MCUs with 64 digital I/O pins (100-pin TQFP) or 32 digital I/O pins (64-pin TQFP).
Highlighted features are listed below. Refer to Table 1.1 for specific product feature selection.
• High-Speed pipelined 8051-compatible CIP-51 microcontroller core (100 MIPS or 50 MIPS)
• In-system, full-speed, non-intrusive debug interface (on-chip)
• True 12 or 10-bit 100 ksps ADC with PGA and 8-channel analog multiplexer
• True 8-bit 500 ksps ADC with PGA and 8-channel analog multiplexer (C8051F12x Family)
• Two 12-bit DACs with programmable update scheduling (C8051F12x Family)
• 2-cycle 16 by 16 Multiply and Accumulate Engine (C8051F120/1/2/3 and C8051F130/1/2/3)
• 128 or 64 kB of in-system programmable Flash memory
• 8448 (8 k + 256) bytes of on-chip RAM
• External Data Memory Interface with 64 kB address space
• SPI, SMBus/I2C, and (2) UART serial interfaces implemented in hardware
• Five general purpose 16-bit Timers
• Programmable Counter/Timer Array with 6 capture/compare modules
• On-chip Watchdog Timer, VDD Monitor, and Temperature Sensor
With on-chip VDD monitor, Watchdog Timer, and clock oscillator, the C8051F12x and C8051F13x devices
are truly stand-alone System-on-a-Chip solutions. All analog and digital peripherals are enabled/disabled
and configured by user firmware. The Flash memory can be reprogrammed even in-circuit, providing non-
volatile data storage, and also allowing field upgrades of the 8051 firmware.
On-board JTAG debug circuitry allows non-intrusive (uses no on-chip resources), full speed, in-circuit
debugging using the production MCU installed in the final application. This debug system supports inspec-
tion and modification of memory and registers, setting breakpoints, watchpoints, single stepping, run and
halt commands. All analog and digital peripherals are fully functional while debugging using JTAG.
Each MCU is specified for operation over the industrial temperature range (–45 to +85 °C). The Port I/O,
RST, and JTAG pins are tolerant for input signals up to 5 V. The devices are available in 100-pin TQFP or
64-pin TQFP packaging. Table 1.1 lists the specific device features and package offerings for each part
number. Figure 1.1 through Figure 1.6 show functional block diagrams for each device.
Rev. 1.4
19