MC68HC908GR16 Datasheet, PDF (304/310 Pages) Motorola, Inc – Microcontrollers

Freescale Semiconductor, Inc.
Electrical Specifications
20.18 Memory Characteristics
Characteristic
Symbol
Min
Typ
Max
Unit
RAM data retention voltage
FLASH program bus clock frequency
V_RDR
1.3
—
—
V
—
1
—
—
MHz
FLASH read bus clock frequency
f_Read(1)
8k
—
8.4 M
Hz
FLASH page erase time
FLASH mass erase time
FLASH PGM/ERASE to HVEN set up time
FLASH high-voltage hold time
FLASH high-voltage hold time (mass erase)
FLASH program hold time
FLASH program time
t_Erase(2)
1
—
t_MErase(3)
4
—
t_NVS
10
—
t_NVH
5
—
t_NVHL
100
—
t_PGS
5
—
t_PROG
30
—
—
ms
—
ms
—
µs
—
µs
—
µs
—
µs
40
µs
FLASH return to read time
FLASH cumulative program HV period
t_RCV(4)
1
—
—
µs
t_HV(5)
—
—
4
ms
FLASH row erase endurance⁽⁶⁾
—
10k
100k⁽⁷⁾
—
Cycles
FLASH row program endurance⁽⁸⁾
—
10k
100k⁽⁷⁾
—
Cycles
FLASH data retention time⁽⁹⁾
—
10
100⁽¹⁰⁾
—
Years
1. f_Read is defined as the frequency range for which the FLASH memory can be read.
2. If the page erase time is longer than t_Erase (Min), there is no erase-disturb, but it reduces the endurance of the FLASH
memory.
3. If the mass erase time is longer than t_MErase (Min), there is no erase-disturb, but it reduces the endurance of the FLASH
memory.
4. t_RCV is defined as the time it needs before the FLASH can be read after turning off the high voltage charge pump, by
clearing HVEN to logic 0.
5. t_HV is defined as the cumulative high voltage programming time to the same row before next erase.
t_HV must satisfy this condition: t_NVS + t_NVH + t_PGS + (t_PROG × 64) ≤ t_HV max.
6. The minimum row endurance value specifies each row of the FLASH memory is guaranteed to work for at least this many
erase / program cycles.
7. FLASH endurance is a function of the temperature at which erasure occurs. Typical endurance degrades when the
temperature while erasing is less than 25°C.
8. The minimum row endurance value specifies each row of the FLASH memory is guaranteed to work for at least this many
erase / program cycles.
9. The FLASH is guaranteed to retain data over the entire operating temperature range for at least the minimum time
specified.
10. Motorola performs reliability testing for data retention. These tests are based on samples tested at elevated temperatures.
Due to the higher activation energy of the elevated test temperature, calculated life tests correspond to more than 100
years of operation/storage at 55°C
Data Sheet
304
Electrical Specifications
For More Information On This Product,
Go to: www.freescale.com
MC68HC908GR16 — Rev. 1.0
MOTOROLA