82374EB Datasheet, PDF (193/208 Pages) Intel Corporation – SYSTEM COMPONENT (ESC)

82374EB 82374SB
The sequence of the ATE test is as follows
1 Drive TEST low IRQ3 high and IRQ5 high
2 Drive each pin that is a part of the NAND Tree high Please note that not every pin is included in the tree
See table below for details
3 Starting at pin 165 (DLIGHT ) and continuing with pins 167 168 etc individually drive each pin low
Expect EISAHOLD to toggle after each corresponding input pin is toggled The final pin in the tree is pin 100
(EISAHOLD) Not every pin is toggled in sequential order Please refer to the table for tree ordering When
IRQ3 is driven low the test mode is exited and the ESC’s buffers will be enabled
4 Before enabling the ESC’s buffers (via IRQ3) turn off tester drivers
5 Reset the ESC prior to proceeding with further testing
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