SMJ320C80 Datasheet, PDF (1/157 Pages) Texas Instruments – DIGITAL SIGNAL PROCESSOR

D Single-Chip Parallel Multiple
Instruction/Multiple Data (MIMD) Digital
Signal Processor (DSP)
D More Than Two Billion RISC-Equivalent
Operations per Second
D Master Processor (MP)
– 32-Bit Reduced Instruction Set
Computing (RISC) Processor
– IEEE-754 Floating-Point Capability
– 4K-Byte Instruction Cache
– 4K-Byte Data Cache
D Four Parallel Processors (PP)
– 32-Bit Advanced DSPs
– 64-Bit Opcode Provides Many Parallel
Operations per Cycle
– 2K-Byte Instruction Cache and 8K-Byte
Data RAM per PP
D Transfer Controller (TC)
– 64-Bit Data Transfers
– Up to 400 Megabytes per Second (MBps)
Transfer Rate
– 32-Bit Addressing
– Direct DRAM/VRAM Interface With
Dynamic Bus Sizing
– Intelligent Queuing and Cycle
Prioritization
D Video Controller (VC)
– Provides Video Timing and Video
Random-Access Memory (VRAM)
Control
– Dual-Frame Timers for Two Simultaneous
Image-Capture and/or Display Systems
D Big- or Little-Endian Operation
D 50K-Byte On-Chip RAM
D 4G-Byte Address Space
D 20-ns Cycle Time
D 3.3-V Operation
D IEEE Standard 1149.1^† Test Access Port
(JTAG)
D Operating Temperature Range
–55°C to 125°C - M-Temperature
–40°C to 85°C - A-Temperature
SMJ320C80
DIGITAL SIGNAL PROCESSOR
SGUS025B – AUGUST 1998 – REVISED JUNE 2002
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
† _{IEEE Standard 1149.1–1990, IEEE Standard Test Access Port and Boundary-Scan Architecture}
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright  2002, Texas Instruments Incorporated
On products compliant to MILĆPRFĆ38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
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