TLK3134_1 Datasheet, PDF (147/150 Pages) Texas Instruments – 4-Channel Multi-Rate Transceiver

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C APPENDIX C – Device Test Mode
TLK3134
4-Channel Multi-Rate Transceiver
SLLS838D – MAY 2007 – REVISED JULY 2008
This device can be placed into one of the three modes: functional mode including JTAG testing mode,
scan testing mode, and Jadis/eFuse testing mode. The scan testing mode and Jadis/eFuse testing modes
are for TI use only, and may be ignored by external users of this device.
FUNCTIONAL DEVICE PIN
NAME
TESTEN
GPI1
Table C-1. Device Mode Configuration
FUNCTIONAL MODE/JTAG TESTING
0 or 1
0
SCAN MODE
0
1
Jadis/eFuse MODE
1
1
FUNCTION
AL DEVICE
PIN NAME
SPEED1
SPEED0
PLOOP
SLOOP
PRBS_EN
CODE
TDI
PRTAD4
PRTAD3
PRTAD2
PRTAD1
PRTAD0
GPO0
GPO1
GPO2
GPO3
GPO4
Table C-2. Device Test Mode Pin Configuration
FUNCTIONAL MODE
SIGNAL DIRECTION
I
I
I
I
I
I
I
I
I
I
I
I
O
O
O
O
O
TEST
MODE
SIGNAL
DIRECTION
I
I
I
I
I
I
I
I
I
I:
Jadis/eFuse
O: Scan
I
I
O
O
O
O
O
FUNCTIONAL
MODE/JTAG TESTING
SPEED1
SPEED0
PLOOP
SLOOP
PRBS_EN
CODE
TDI
PRTAD4
PRTAD3
PRTAD2
PRTAD1
PRTAD0
TEST_DOUT0
TEST_DOUT1
TEST_DOUT2
TEST_DOUT3
TEST_DOUT4 or JC PLL
Digital Test Out
SCAN MODE
Jadis/eFuse MODE
Scan In 5
Scan In 4
Scan In 3
Scan In 2
Scan In 1
Scan Enable
Adaptive Scan Enable
(Test Mode)
Scan HS Enable
(Transition Fault)
Scan Clock
STCI_D
EFUSE_TMS
EFUSE_TDI
STCICFG1
EFUSE_INITZ
TESTCLK_T
JADIS_EFUSE_SEL
TESTCLK_R
STCICLK
Scan Out 5
STCICFG0
Scan Clock Select (0: from
device pin, 1: from Jadis), EFUSE_SYS_CLK
also EFUSE_SYS_CLK
HSTL Force Down
EFUSE_TCK
Scan Out 4
Tied LOW
Scan Out 3
Tied LOW
Scan Out 2
STCI_Q
Scan Out 1
EFUSE_TDO
Burnin_Output
Burnin_Output
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APPENDIX C – Device Test Mode 147