MC9S12KG128 Datasheet, PDF (506/600 Pages) Freescale Semiconductor, Inc – Microcontrollers

Chapter 17 Interrupt (INTV1)
Table 17-2. ITCR Field Descriptions
Field
Description
4
WRTINT
3:0
ADR[3:0]
Write to the Interrupt Test Registers
Read: anytime
Write: only in special modes and with I-bit mask and X-bit mask set.
0 Disables writes to the test registers; reads of the test registers will return the state of the interrupt inputs.
1 Disconnect the interrupt inputs from the priority decoder and use the values written into the ITEST registers
instead.
Note: Any interrupts which are pending at the time that WRTINT is set will remain until they are overwritten.
Test Register Select Bits
Read: anytime
Write: anytime
These bits determine which test register is selected on a read or write. The hexadecimal value written here will
be the same as the upper nibble of the lower byte of the vector selects. That is, an “F” written into ADR[3:0] will
select vectors 0xFFFE–0xFFF0 while a “7” written to ADR[3:0] will select vectors 0xFF7E–0xFF70.
17.3.2.2 Interrupt Test Registers
R
W
Reset
7
INTE
0
6
INTC
5
INTA
4
INT8
3
INT6
2
INT4
0
0
0
0
0
= Unimplemented or Reserved
Figure 17-3. Interrupt TEST Registers (ITEST)
1
INT2
0
0
INT0
0
Read: Only in special modes. Reads will return either the state of the interrupt inputs of the interrupt
sub-block (WRTINT = 0) or the values written into the TEST registers (WRTINT = 1). Reads will always
return 0s in normal modes.
Write: Only in special modes and with WRTINT = 1 and CCR I mask = 1.
Table 17-3. ITEST Field Descriptions
Field
7:0
INT[E:0]
Description
Interrupt TEST Bits — These registers are used in special modes for testing the interrupt logic and priority
independent of the system configuration. Each bit is used to force a specific interrupt vector by writing it to a
logic 1 state. Bits are named INTE through INT0 to indicate vectors 0xFFxE through 0xFFx0. These bits can be
written only in special modes and only with the WRTINT bit set (logic 1) in the interrupt test control register
(ITCR). In addition, I interrupts must be masked using the I bit in the CCR. In this state, the interrupt input lines
to the interrupt sub-block will be disconnected and interrupt requests will be generated only by this register.
These bits can also be read in special modes to view that an interrupt requested by a system block (such as a
peripheral block) has reached the INT module.
There is a test register implemented for every eight interrupts in the overall system. All of the test registers share
the same address and are individually selected using the value stored in the ADR[3:0] bits of the interrupt test
control register (ITCR).
Note: When ADR[3:0] have the value of 0x000F, only bits 2:0 in the ITEST register will be accessible. That is,
vectors higher than 0xFFF4 cannot be tested using the test registers and bits 7:3 will always read as a
logic 0. If ADR[3:0] point to an unimplemented test register, writes will have no effect and reads will always
return a logic 0 value.
MC9S12KG128 Data Sheet, Rev. 1.15
506
Freescale Semiconductor