MC9S12KG128 Datasheet, PDF (505/600 Pages) Freescale Semiconductor, Inc – Microcontrollers

Chapter 17 Interrupt (INTV1)
17.2 External Signal Description
Most interfacing with the interrupt sub-block is done within the core. However, the interrupt does receive
direct input from the multiplexed external bus interface (MEBI) sub-block of the core for the IRQ and
XIRQ pin data.
17.3 Memory Map and Register Definition
Detailed descriptions of the registers and associated bits are given in the subsections that follow.
17.3.1 Module Memory Map
Table 17-1. INT Memory Map
Address
Offset
0x0015
0x0016
0x001F
Use
Interrupt Test Control Register (ITCR)
Interrupt Test Registers (ITEST)
Highest Priority Interrupt (Optional) (HPRIO)
17.3.2 Register Descriptions
Access
R/W
R/W
R/W
17.3.2.1 Interrupt Test Control Register
7
6
5
4
3
2
R
0
0
0
WRTINT
ADR3
ADR2
W
Reset
0
0
0
0
1
1
= Unimplemented or Reserved
Figure 17-2. Interrupt Test Control Register (ITCR)
Read: See individual bit descriptions
Write: See individual bit descriptions
1
ADR1
1
0
ADR0
1
MC9S12KG128 Data Sheet, Rev. 1.15
Freescale Semiconductor
505