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| SAM7S256_14 Datasheet, PDF (49/775 Pages) ATMEL Corporation – ARM-based Flash MCU | |||
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12.3.2 Test Environment
Figure 12-3 on page 49 shows a test environment example. Test vectors are sent and interpreted by the tester. In
this example, the âboard in testâ is designed using a number of JTAG-compliant devices. These devices can be
connected to form a single scan chain.
Figure 12-3. Application Test Environment Example
Test Adaptor
Tester
JTAG
Interface
ICE/JTAG
Connector
Chip n
Chip 2
SAM7S
Chip 1
SAM7S-based Application Board In Test
SAM7S Series [DATASHEET] 49
6175MâATARMâ26-Oct-12
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