SAM7S256_14 Datasheet, PDF (47/775 Pages) ATMEL Corporation – ARM-based Flash MCU

12. Debug and Test Features
12.1
Description
The SAM7S Series Microcontrollers feature a number of complementary debug and test capabilities. A common
JTAG/ICE (EmbeddedICE) port is used for standard debugging functions, such as downloading code and single-
stepping through programs. The Debug Unit provides a two-pin UART that can be used to upload an application
into internal SRAM. It manages the interrupt handling of the internal COMMTX and COMMRX signals that trace the
activity of the Debug Communication Channel.
A set of dedicated debug and test input/output pins gives direct access to these capabilities from a PC-based test
environment.
12.2 Block Diagram
Figure 12-1. Debug and Test Block Diagram
TMS
TCK
TDI
Boundary
TAP
ICE/JTAG
TAP
ICE
ARM7TDMI
PDC
DBGU
Reset
and
Test
JTAGSEL
TDO
POR
TST
DTXD
DRXD
SAM7S Series [DATASHEET] 47
6175M–ATARM–26-Oct-12