SM320F2812-HT Datasheet, PDF (20/155 Pages) Texas Instruments – Digital Signal Processor

SM320F2812-HT
SGUS062A – JUNE 2009 – REVISED APRIL 2010
www.ti.com
NAME
TRST
TCK
TMS
TDI
TDO
EMU0
EMU1
PIN NO.
172-PIN
HFG
132
133
123
128
124
133
143
Table 2-3. Signal Descriptions ⁽¹⁾ (continued)
DIE PAD
NO.
DIE PAD
X-CENTER
(mm)
148
42.6
149
42.6
139
872.5
144
350.4
140
777.9
150
42.6
161
42.6
DIE PAD
Y-CENTER
(mm)
4684.8
4605.1
5057.5
5057.5
5057.5
4525.3
3430.9
I/O/Z⁽²⁾ PU/PD⁽³⁾
DESCRIPTION
I
I
I
I
O/Z
I/O/Z
I/O/Z
JTAG test reset with internal pulldown.
TRST, when driven high, gives the scan
system control of the operations of the
device. If this signal is not connected or
driven low, the device operates in its
functional mode, and the test reset signals
are ignored.
NOTE: Do not use pullup resistors on
TRST; it has an internal pulldown device. In
PD ^{a low-noise environment, TRST can be left}
floating. In a high-noise environment, an
additional pulldown resistor may be
needed. The value of this resistor should be
based on drive strength of the debugger
pods applicable to the design. A 2.2-kΩ
resistor generally offers adequate
protection. Since this is application specific,
it is recommended that each target board is
validated for proper operation of the
debugger and the application.
PU JTAG test clock with internal pullup
JTAG test-mode select (TMS) with internal
PU
pullup. This serial control input is clocked
into the TAP controller on the rising edge of
TCK.
JTAG test data input (TDI) with internal
PU
pullup. TDI is clocked into the selected
register (instruction or data) on a rising
edge of TCK.
JTAG scan out, test data output (TDO). The
–
contents of the selected register (instruction
or data) is shifted out of TDO on the falling
edge of TCK.
Emulator pin 0. When TRST is driven high,
PU
this pin is used as an interrupt to or from
the emulator system and is defined as
input/output through the JTAG scan.
Emulator pin 1. When TRST is driven high,
PU
this pin is used as an interrupt to or from
the emulator system and is defined as
input/output through the JTAG scan.
20
Introduction
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