N25Q032A13E1241F Datasheet, PDF (140/153 Pages) Micron Technology – 32-Mbit 3 V, multiple I/O, 4-Kbyte subsector erase, XiP enabled, serial flash memory with 108 MHz SPI bus interface

DC and AC parameters
N25Q032 - 3 V
Table 32. Reset Conditions
Symbol Alt.
Parameter
Conditions
Min Typ Max Unit
tRLRH⁽¹⁾⁽²⁾ tRST Reset pulse width
50 ns
Device selected (S low), while decoding
any modify instruction, during all read
operations, CLFSR, WRDI, WREN,
WRLR, WRVCR, WRVECR.
40 ns
Under completion of an internal erase or
program cycle related to POTP, PP, DIEFP,
DIFP, QIEFP, QIFP, SE, BE, PER, PES.
30 µs
tRHSL⁽¹⁾
tREC
Reset Recovery
Time
Under completion of an SSE operation.
Under completion of an WRSR operation.
t_SSE
t_W
ms
ms
Under completion of an WRNVCR
operation.
t_WNVCR
ms
Device deselected (S high) and in XiP
mode.
40 ns
Device deselected (S high) and in Standby
mode.
40 ns
tSHRV⁽¹⁾
S# deselect to R Deselect to R valid in Quad Output or in
valid
QIO-SPI.
2 ns
1. All values are guaranteed by characterization and not 100% tested in production.
2. The device reset is possible but not guaranteed if tRLRH < 50 ns.
Figure 105. Serial input timing
S
tCHSL
C
tDVCH
DQ0
tSLCH
tCHDX
MSB IN
tSHSL
tCHSH
tSHCH
tCLCH
LSB IN
tCHCL
DQ1
High Impedance
AI13728
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