English
Language : 

N25Q032A13E1241F Datasheet, PDF (136/153 Pages) Micron Technology – 32-Mbit 3 V, multiple I/O, 4-Kbyte subsector erase, XiP enabled, serial flash memory with 108 MHz SPI bus interface
DC and AC parameters
14 DC and AC parameters
N25Q032 - 3 V
Note:
This section summarizes the operating and measurement conditions, and the DC and AC
characteristics of the device. The parameters in the DC and AC characteristics tables that
follow are derived from tests performed under the measurement conditions summarized in
the relevant tables. Designers should check that the operating conditions in their circuit
match the measurement conditions when relying on the quoted parameters.
Table 27. Operating conditions
Symbol
Parameter
VCC
VPPH
TA
Supply voltage
Supply voltage on VPP
Ambient operating temperature
Table 28. AC measurement conditions
Symbol
Parameter
CL
Load capacitance
Input rise and fall times
Input pulse voltages
Input timing reference voltages
Output timing reference voltages
Min Typ Max Unit
2.7
3.6 V
8.5
9.5 V
–40
85 °C
Min
Max
30(1)
5
0.2VCC to 0.8VCC(2)
0.3VCC to 0.7VCC
VCC / 2
Unit
pF
ns
V
V
V
1) Output Buffers are configurable by user.
2) For QUAD/DUAL operations: 0 to Vcc.
Figure 103. AC measurement I/O waveform
Input levels
0.8VCC
0.2VCC
Input and output
timing reference levels
0.7VCC
0.5VCC
0.3VCC
AI07455
For 0.8VCC: for QUAD/DUAL operations, this is VCC; for 0.2VCC: for QUAD/DUAL
operations, this is 0V
Table 29. Capacitance(1)
Symbol
Parameter
Test condition
CIN/OUT
Input/output capacitance
(DQ0/DQ1/DQ2/DQ3)
VOUT = 0 V
CIN Input capacitance (other pins)
VIN = 0 V
1. Sampled only, not 100% tested, at TA=25 °C and a frequency of 54 MHz.
Min Max Unit
8
pF
6
pF
136/153
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2010 Micron Technology, Inc. All rights reserved.