MEGA128CAN Datasheet, PDF (289/413 Pages) ATMEL Corporation – Microcontroller WITH 128K BYTES OF ISP FLASH AND CAN CONTROLLER

Using the JTAG
Programming
Capabilities
Bibliography
AT90CAN128
The OCDR Register provides a communication channel from the running program in the
microcontroller to the debugger. The CPU can transfer a byte to the debugger by writing
to this location. At the same time, an internal flag; I/O Debug Register Dirty – IDRD – is
set to indicate to the debugger that the register has been written. When the CPU reads
the OCDR Register the 7 LSB will be from the OCDR Register, while the MSB is the
IDRD bit. The debugger clears the IDRD bit when it has read the information.
In some AVR devices, this register is shared with a standard I/O location. In this case,
the OCDR Register can only be accessed if the OCDEN Fuse is programmed, and the
debugger enables access to the OCDR Register. In all other cases, the standard I/O
location is accessed.
Refer to the debugger documentation for further information on how to use this register.
Programming of AVR parts via JTAG is performed via the 4-pin JTAG port, TCK, TMS,
TDI, and TDO. These are the only pins that need to be controlled/observed to perform
JTAG programming (in addition to power pins). It is not required to apply 12V externally.
The JTAGEN Fuse must be programmed and the JTD bit in the MCUCR Register must
be cleared to enable the JTAG Test Access Port.
The JTAG programming capability supports:
• Flash programming and verifying.
• EEPROM programming and verifying.
• Fuse programming and verifying.
• Lock bit programming and verifying.
The Lock bit security is exactly as in parallel programming mode. If the Lock bits LB1 or
LB2 are programmed, the OCDEN Fuse cannot be programmed unless first doing a
chip erase. This is a security feature that ensures no back-door exists for reading out the
content of a secured device.
The details on programming through the JTAG interface and programming specific
JTAG instructions are given in the section “JTAG Programming Overview” on page 342.
For more information about general Boundary-scan, the following literature can be
consulted:
• IEEE: IEEE Std 1149.1-1990. IEEE Standard Test Access Port and Boundary-scan
Architecture, IEEE, 1993.
• Colin Maunder: The Board Designers Guide to Testable Logic Circuits, Addison-
Wesley, 1992.
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