AMD-K6-2E Datasheet, PDF (142/332 Pages) Advanced Micro Devices – AMD-K6™-2E Embedded Processor

AMD-K6™-2E Processor Data Sheet
Preliminary Information
22529B/0—January 2000
5.46
TCK (Test Clock)
Pin Attribute
Pin Location
Summary
Input, Internal Pullup
M-34
TCK is the clock for boundary-scan testing using the Test
Access Port (TAP). See “Boundary-Scan Test Access Port
(TAP)” on page 229 for details regarding the operation of the
TAP controller.
Sampled
The processor always samples TCK, except while TRST# is
asserted.
5.47
TDI (Test Data Input)
Pin Attribute
Input, Internal Pullup
Pin Location
Summary
Sampled
N-35
TDI is the serial test data and instruction input for
boundary-scan testing using the Test Access Port (TAP). See
“Boundary-Scan Test Access Port (TAP)” on page 229 for details
regarding the operation of the TAP controller.
The processor samples TDI on every rising TCK edge, but only
while in the Shift-IR and Shift-DR states.
5.48
TDO (Test Data Output)
Pin Attribute
Pin Location
Output
N-33
Summary
TDO is the serial test data and instruction output for
boundary-scan testing using the Test Access Port (TAP). See
“Boundary-Scan Test Access Port (TAP)” on page 229 for details
regarding the operation of the TAP controller.
Driven and Floated
The processor drives TDO on every falling TCK edge, but only
while in the Shift-IR and Shift-DR states. TDO is floated at all
other times.
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Signal Descriptions
Chapter 5