PIC18F6525_13 Datasheet, PDF(331/400 Page) Microchip Technology – 64/80-Pin High-Performance, 64-Kbyte Enhanced Flash Microcontrollers with A/D

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PIC18F6525_13 Datasheet, PDF (331/400 Pages) Microchip Technology – 64/80-Pin High-Performance, 64-Kbyte Enhanced Flash Microcontrollers with A/D

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PIC18F6525/6621/8525/8621

27.3 DC Characteristics: PIC18F6525/6621/8525/8621 (Industrial, Extended)

PIC18LF6X2X/8X2X (Industrial)

DC CHARACTERISTICS

Standard Operating Conditions (unless otherwise stated)

Operating temperature -40Â°C ï£ï TA ï£ +85Â°C for industrial

-40Â°C ï£ï TA ï£ +125Â°C for extended

Param

No.

Symbol

Characteristic

Min

Max Units

Conditions

VIL

Input Low Voltage

I/O ports:

D030

with TTL buffer

VSS

0.15 VDD V VDD < 4.5V

D030A

â

0.8

V 4.5V ï£ VDD ï£ï 5.5V

D031

with Schmitt Trigger buffer

VSS

RC3 and RC4

VSS

0.2 VDD

V

0.3 VDD

V

D032

MCLR

VSS

0.2 VDD

V

D033

OSC1

VSS

0.3 VDD V HS, HS+PLL modes

D033A

OSC1

VSS

0.2 VDD

V RC, EC modes

D033B

OSC1

VSS

0.3

V XT, LP modes

D034

T1OSI

VSS

0.3

V

VIH

Input High Voltage

I/O ports:

D040

with TTL buffer

0.25 VDD + 0.8V VDD

V VDD < 4.5V

D040A

2.0

VDD

V 4.5V ï£ VDD ï£ï 5.5V

D041

with Schmitt Trigger buffer

RC3 and RC4

0.8 VDD

0.7 VDD

VDD

V

VDD

V

D042

MCLR, OSC1 (EC mode)

0.8 VDD

VDD

V

D043

OSC1

0.7 VDD

VDD

V HS, HS+PLL modes

D043A

D043B

OSC1

OSC1

0.8 VDD

0.9 VDD

VDD

V EC mode

VDD

V RC mode(1)

D043C

OSC1

1.6

VDD

V XT, LP modes

D044

T13CKI

1.6

VDD

V

IIL

Input Leakage Current(2,3)

D060

I/O ports

â

ï±1

ïA VSS ï£ï VPIN ï£ï VDD,

Pin at high-impedance

D061

MCLR

â

ï±5

ïA VSS ï£ï VPIN ï£ï VDD

D063

OSC1

â

ï±5

ïA VSS ï£ï VPIN ï£ï VDD

IPU

Weak Pull-up Current

D070 IPURB PORTB weak pull-up current

50

400

ïA VDD = 5V, VPIN = VSS

Note 1: In RC oscillator configuration, the OSC1/CLKI pin is a Schmitt Trigger input. It is not recommended that the

PICÂ® device be driven with an external clock while in RC mode.

2: The leakage current on the MCLR pin is strongly dependent on the applied voltage level. The specified

levels represent normal operating conditions. Higher leakage current may be measured at different input

voltages.

3: Negative current is defined as current sourced by the pin.

4: Parameter is characterized but not tested.

ï£ 2003-2013 Microchip Technology Inc.

DS39612C-page 331

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