MC68HC11G5 Datasheet, PDF (170/195 Pages) Motorola, Inc – High-density Complementary Metal Oxide Semiconductor (HCMOS) Microcontroller

Freescale Semiconductor, Inc.
VDD
R2
Test
Point
C1
R1
Equivalent Test Load ¹
Pins
PA0-7, PB0-7, PC0-7, PD0, PD5,
PF0-7, PG0-7, PH0-7, PJ0-3, E, R/W
PD1-PD4
R1
3.26kΩ
3.26kΩ
R2
2.38kΩ
2.38kΩ
C1
90pF
200pF
V _DD
Clocks
Inputs
Outputs
V _DD
V _SS
D.C. Testing
0.4V
V _SS
Nominal Timing
0.4V
Nom.
VDD – 0.8V
0.4V
VDD – 0.8V
Nom.
— 70% of VDD
— 20% of VDD
V _DD
Clocks
Inputs
Outputs
V _DD
V _SS
A.C. Testing
20% of VDD _VSS
Spec Timing
70% of VDD
20% of VDD
Spec
Spec
(See Note 2)
70% of VDD
20% of VDD
— VDD – 0.8V
— 0.4V
70% of VDD
20% of VDD
Notes: 1. Full test loads are applied during all DC electrical tests and AC timing measurements.
2. During AC timing measurements, inputs are driven to 0.4 volts and VDD – 0.8
volts while timing measurements are taken at the 20% and 70% of VDD points.
Figure 13-1. Test Methods
13-4
ELECTRICAL SPECIFICATIONS
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