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C8051F52X_12 Datasheet, PDF (28/221 Pages) Silicon Laboratories – 8/4/2 kB ISP Flash MCU Family | |||
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C8051F52x/F53x
Table 2.3. ADC0 Electrical Characteristics
VDD = 2.1 V, VREF = 1.5 V (REFSL=0), â40 to +125 °C unless otherwise specified.
Parameter
Conditions
Min Typ Max Units
DC Accuracy
Resolution
12
bits
Integral Nonlinearity
â
â
±3
LSB
Differential Nonlinearity
Offset Error1
Guaranteed Monotonic
â
â
±1
LSB
â10 ±1
+10
LSB
Full Scale Error
â20 ±1
+20
LSB
Dynamic Performance (10 kHz sine-wave Single-ended input, 0 to 1 dB below Full Scale, 200 ksps)
Signal-to-Noise Plus Distortion
Total Harmonic Distortion
Up to the 5th harmonic
60
66
â
dB
â
74
â
dB
Spurious-Free Dynamic Range
â
88
â
dB
Conversion Rate
SAR Conversion Clock
Burst Mode Oscillator
Conversion Time in SAR Clocks2
Track/Hold Acquisition Time3,6
Throughput Rate4
â
â
3
MHz
â
â
27
MHz
â
13
â
clocks
1
â
â
µs
â
â
200
ksps
Analog Inputs
ADC Input Voltage Range5
Absolute Pin Voltage wrt to GND
Sampling Capacitance
Input Multiplexer Impedance
gain = 1.0 (default)
gain = n
0
â
VREF
V
0
â VREF / n
0
â
VREGIN
V
â
24
â
pF
â
1.5
â
kï
Power Specifications
Power Supply Current (from VDD)
Burst Mode (Idle)
Power-on Time
Power Supply Rejection
Operating Mode, 200 ksps
â 1050 1400
µA
â 930
â
µA
â
5
â
µs
â
1
â
mV/V
Notes:
1. Represents one standard deviation from the mean. Offset and full-scale error can be removed through
calibration.
2. An additional 2 FCLK cycles are required to start and complete a conversion.
3. Additional tracking time may be required depending on the output impedance connected to the ADC input.
See Section â4.3.6. Settling Time Requirementsâ on page 60.
4. An increase in tracking time will decrease the ADC throughput.
5. See Section â4.4. Selectable Gainâ on page 60 for more information about setting the gain.
6. Additional tracking time might be needed ifVDD < 2.0 V; See Section â11.2.1. VDD Monitor Thresholds and
Minimum VDDâ on page 108 for minimum VDD requirements.
28
Rev. 1.4
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