C509-L_97 Datasheet, PDF (271/290 Pages) Siemens Semiconductor Group – 8-Bit CMOS Microcontroller

Device Specifications
C509-L
11 Device Specifications
11.1 Absolute Maximum Ratings
Ambient temperature under bias (T_A) ......................................................... – 40 to 110 °C
Storage temperature (T_stg) .......................................................................... – 65 °C to 150 °C
Voltage on V_CC pins with respect to ground (V_SS) ....................................... – 0.5 V to 6.5 V
Voltage on any pin with respect to ground (V_SS) ......................................... – 0.5 V to V_CC +0.5 V
Input current on any pin during overload condition..................................... – 10 mA to 10 mA
Absolute sum of all input currents during overload condition ..................... I 100 mA I
Power dissipation........................................................................................ 1 W
Note: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent
damage of the device. This is a stress rating only and functional operation of the device at
these or any other conditions above those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating conditions for longer
periods may affect device reliability. During overload conditions (V_IN > V_CC or V_IN < V_SS) the
Voltage on V_CC pins with respect to ground (V_SS) must not exceed the values defined by the
absolute maximum ratings.
11.2 DC Characteristics
V_CC = 5 V + 10%, – 5%; V_SS = 0 V
Parameter
Input low voltage
(except EA, RESET, HWPD)
Input low voltage (EA)
Input low voltage (HWPD,
RESET)
Input low voltage (CMOS)
(ports 0 - 9)
Input high voltage (except
RESET, XTAL2 and HWPD
Input high voltage to XTAL2
Input high voltage to RESET and
HWPD
Input high voltage (CMOS)
(ports 0 - 9)
CMOS input hysteresis
(ports 1, 3 to 9)
T_A = 0 to 70 °C for the SAB-C509
T_A = – 40 to 85 °C for the SAF-C509
Symbol
Limit Values
min.
max.
V_IL
– 0.5
0.2 V_CC –
0.1
V_IL1
– 0.5
0.2 V_CC –
0.3
V_IL2
– 0.5
0.2 V_CC
Unit
V
V
V
Test Condition
–
–
–
V_ILC
– 0.5
0.3 V_CC V
–
V_IH
0.2 V_CC + V_CC + 0.5 V
–
0.9
V_IH1
0.7 V_CC V_CC + 0.5 V
–
V_IH2
0.6 V_CC V_CC + 0.5 V
–
V_IHC
0.7 V_CC V_CC + 0.5 V
–
V_IHYS
0.1
–
V–
Semiconductor Group
11-1
1997-10-01