PIC18F2331_07 Datasheet, PDF (371/400 Pages) Microchip Technology – 28/40/44-Pin Enhanced Flash Microcontrollers with nanoWatt Technology, High Performance PWM and A/D

PIC18F2331/2431/4331/4431
TABLE 25-21: A/D CONVERTER CHARACTERISTICS: PIC18F2331/2431/4331/4431 (INDUSTRIAL)
PIC18LF2331/2431/4331/4431 (INDUSTRIAL)
Param
No.
Symbol
Characteristic
Min
Typ
Max
Units
Conditions
Device Supply
AVDD Analog VDD Supply
VDD – 0.3
—
VDD + 0.3
V
AVSS Analog VSS Supply
VSS – 0.3
—
VSS + 0.3
V
IAD
Module Current
(during conversion)
—
500
—
250
—
μA VDD = 5V
—
μA VDD = 2.5V
IADO
Module Current Off
—
—
1.0
μA
AC Timing Parameters
A10
FTHR Throughput Rate
—
—
200
ksps VDD = 5V, single channel
—
—
75
ksps VDD < 3V, single channel
A11
TAD
A/D Clock Period
385
—
20,000
ns VDD = 5V
1000
—
20,000
ns VDD = 3V
A12
TRC
A/D Internal RC Oscillator Period
—
—
—
A13
TCNV
Conversion Time⁽¹⁾
12
A14
TACQ
Acquisition Time⁽²⁾
2⁽²⁾
500
750
10000
12
—
1500
2250
20000
12
—
ns PIC18F parts
ns PIC18LF parts
ns AVDD < 3.0V
TAD
TAD
A16
TTC
Conversion Start from External
1/4 TCY
—
—
Reference Inputs
A20
VREF Reference Voltage for 10-Bit
Resolution (VREF+ – VREF-)
1.5
—
AVDD – AVSS V VDD ≥ 3V
1.8
—
AVDD – AVSS V VDD < 3V
A21
VREFH Reference Voltage High
(AVDD or VREF+)
1.5V
—
AVDD
V VDD ≥ 3V
A22
VREFL Reference Voltage Low
(AVSS or VREF-)
AVSS
—
VREFH – 1.5V V
A23
IREF
Reference Current
—
150 μA
—
—
75 μA
—
VDD = 5V
VDD = 2.5V
Analog Input Characteristics
A26
VAIN
Input Voltage⁽³⁾
AVSS – 0.3
—
AVDD + 0.3
V
A30
ZAIN
Recommended Impedance of
Analog Voltage Source
—
—
2.5
kΩ
A31
ZCHIN Analog Channel Input Impedance
—
—
10.0
kΩ VDD = 3.0 V
DC Performance
A41
NR
Resolution
10 bits
—
A42
EIL
Integral Nonlinearity
—
—
<±1
LSb VDD ≥ 3.0V
VREFH ≥ 3.0V
A43
EIL
Differential Nonlinearity
—
—
<±1
LSb VDD ≥ 3.0V
VREFH ≥ 3.0V
A45
EOFF Offset Error
—
±0.5
<±1.5
LSb VDD ≥ 3.0V
VREFH ≥ 3.0V
A46
EGA
Gain Error
A47
—
Monotonicity⁽⁴⁾
—
±0.5
<±1.5
guaranteed
LSb VDD ≥ 3.0V
VREFH ≥ 3.0V
— VDD ≥ 3.0V
VREFH ≥ 3.0V
Note 1:
2:
3:
4:
Conversion time does not include acquisition time. See Section 20.0 “10-Bit High-Speed Analog-to-Digital Converter
(A/D) Module” for a full discussion of acquisition time requirements.
In Sequential modes, TACQ should be 12 TAD or greater.
For VDD < 2.7V and temperature below 0°C, VAIN should be limited to range < VDD/2.
The A/D conversion result never decreases with an increase in the input voltage and has no missing codes.
© 2007 Microchip Technology Inc.
Preliminary
DS39616C-page 369